Failure Analysis Service and Scanning Electron Microscopy (SEM)

Failure Analysis, Materials Characterization and SEM Services

• Failure Analysis

• Materials Characterization

• Scanning Electron Microscopy (SEM) with Elemental Analysis (EDS)

• FTIR (Fourier Transform Infrared Spectroscopy)

• EDS Analysis (Elemental Analysis)

• Optical Microscopy/Microphotography

• Metallographic Cross-Sectioning

• IC Decapsulation

• Electronic Component Design Evaluation

• Solder Analysis

• Printed Wiring Board (PWB) Procurement Support